Outlook and Challenges of Nano Devices, Sensors, and MEMS

Author:   Ting Li ,  Ziv Liu ,  Zhiwei Liu
Publisher:   Springer International Publishing AG
Edition:   1st ed. 2017
ISBN:  

9783319508221


Pages:   521
Publication Date:   01 March 2017
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Outlook and Challenges of Nano Devices, Sensors, and MEMS


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Author:   Ting Li ,  Ziv Liu ,  Zhiwei Liu
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   1st ed. 2017
Dimensions:   Width: 15.50cm , Height: 3.00cm , Length: 23.50cm
Weight:   1.212kg
ISBN:  

9783319508221


ISBN 10:   3319508229
Pages:   521
Publication Date:   01 March 2017
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida (UCF), Orlando, Florida where he is now the Pegasus Distinguished Professor, Lockheed Martin St. Laurent Professor, and UCF-Analog Devices Fellow. His current research interests are Micro/nanoelectronics computer-aided design, RF device modeling and simulation, and electrostatic discharge (ESD) protection design, modeling and simulation. Dr. Liou holds 8 U.S. patents (3 more filed and pending), and has published 9 books, more than 260 journal papers (including 17 invited review articles), and more than 210 papers (including 90 keynote and invited papers) in international and national conference proceedings.

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