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OverviewThis book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test -- OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits. Full Product DetailsAuthor: Gloria Huertas Sánchez , Diego Vázquez García de la Vega , Adoración Rueda Rueda , Jose Luis Huertas DíazPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2006 ed. Volume: 36 Dimensions: Width: 15.50cm , Height: 2.50cm , Length: 23.50cm Weight: 1.840kg ISBN: 9781402053146ISBN 10: 1402053142 Pages: 452 Publication Date: 06 November 2006 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsOscillation-Based Test Methodology.- Mathematical Review of Non-linear Oscillators.- OBT Methodology for Discrete-Time Filters.- OBT Methodology for discrete-time ?? Modulators.- OBT Implementation in Discrete-Time Filters.- Practical regards for OBT-OBIST implementation.- OBT-OBIST silicon validation.ReviewsAuthor InformationProf. José Luis Huertas is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, that published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design. Tab Content 6Author Website:Countries AvailableAll regions |