Oscillation-Based Test in Mixed-Signal Circuits

Author:   Gloria Huertas Sánchez ,  Diego Vázquez García de la Vega ,  Adoración Rueda Rueda ,  Jose Luis Huertas Díaz
Publisher:   Springer-Verlag New York Inc.
Edition:   2006 ed.
Volume:   36
ISBN:  

9781402053146


Pages:   452
Publication Date:   06 November 2006
Format:   Hardback
Availability:   In Print   Availability explained
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Oscillation-Based Test in Mixed-Signal Circuits


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Overview

This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test -- OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

Full Product Details

Author:   Gloria Huertas Sánchez ,  Diego Vázquez García de la Vega ,  Adoración Rueda Rueda ,  Jose Luis Huertas Díaz
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2006 ed.
Volume:   36
Dimensions:   Width: 15.50cm , Height: 2.50cm , Length: 23.50cm
Weight:   1.840kg
ISBN:  

9781402053146


ISBN 10:   1402053142
Pages:   452
Publication Date:   06 November 2006
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Oscillation-Based Test Methodology.- Mathematical Review of Non-linear Oscillators.- OBT Methodology for Discrete-Time Filters.- OBT Methodology for discrete-time ?? Modulators.- OBT Implementation in Discrete-Time Filters.- Practical regards for OBT-OBIST implementation.- OBT-OBIST silicon validation.

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Author Information

Prof. José Luis Huertas is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, that published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.

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