On-Line Testing for VLSI
Author:   Michael Nicolaidis ,  Yervant Zorian ,  Dhiraj Pradhan
Publisher:   Kluwer Academic Publishers
Edition:   Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998
Volume:   11
ISBN:  

9780792381327


Pages:   160
Publication Date:   30 April 1998
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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On-Line Testing for VLSI


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Author:   Michael Nicolaidis ,  Yervant Zorian ,  Dhiraj Pradhan
Publisher:   Kluwer Academic Publishers
Imprint:   Kluwer Academic Publishers
Edition:   Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998
Volume:   11
Dimensions:   Width: 17.80cm , Height: 1.10cm , Length: 25.40cm
Weight:   1.200kg
ISBN:  

9780792381327


ISBN 10:   0792381327
Pages:   160
Publication Date:   30 April 1998
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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