Nyquist AD Converters, Sensor Interfaces, and Robustness: Advances in Analog Circuit Design, 2012

Author:   Arthur H.M. van Roermund ,  Andrea Baschirotto ,  Michiel Steyaert
Publisher:   Springer-Verlag New York Inc.
Edition:   2013 ed.
ISBN:  

9781489997944


Pages:   294
Publication Date:   13 December 2014
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Nyquist AD Converters, Sensor Interfaces, and Robustness: Advances in Analog Circuit Design, 2012


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Overview

This book is based on the 18 presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. 

Full Product Details

Author:   Arthur H.M. van Roermund ,  Andrea Baschirotto ,  Michiel Steyaert
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2013 ed.
Dimensions:   Width: 15.50cm , Height: 1.60cm , Length: 23.50cm
Weight:   4.628kg
ISBN:  

9781489997944


ISBN 10:   1489997946
Pages:   294
Publication Date:   13 December 2014
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuits for MEMS Microphones.- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments.- Part III: Robustness.- How Can Chips Live Under Radiation?.- TDC and Rad Environments.- Matching and Resolution.- Matching in Polymer and Effect on Circuit Topologies.- Statistical Variability and Reliability in Nano-CMOS Transistors.

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