Next Generation Design and Verification Methodologies for Distributed Embedded Control Systems: Proceedings of the GM R&D Workshop, Bangalore, India, January 2007

Author:   S. Ramesh ,  P. Sampath
Publisher:   Springer-Verlag New York Inc.
Edition:   2007 ed.
ISBN:  

9781402062537


Pages:   300
Publication Date:   28 August 2007
Format:   Hardback
Availability:   In Print   Availability explained
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Next Generation Design and Verification Methodologies for Distributed Embedded Control Systems: Proceedings of the GM R&D Workshop, Bangalore, India, January 2007


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Overview

This volume brings out the proceedings of the workshop “Next Generation Design and Veri?cation Methodologies for Distributed Embedded Control Systems” c- ducted by General Motors R&D, India Science Lab, Bangalore. This workshop is the ?rst of its kind to be organised by an automotive Original Equipment Manufacturer (OEM) to bring together the experts in the ?eld of embedded systems development to present state-of-the-art work, and to discuss future strategies for addressing the increasing complexity of embedded control systems. The theme of the workshop is an important focus area for the current and future automotive systems. Embedded Control Systems are growing in complexity with the increased use of electronics and software in high-integrity applications for automotive and aerospace domains. In these domains, they provide for enhanced safety, automation and c- fort. Such embedded control systems are distributed, fault-tolerant, real-time systems with hybrid (discrete and continuous) behaviour. Furthermore, many of the control functions, such as by-wire controls, have stringent performance and high-integrity requirements. The research community has been addressing these challenges, and over the last few years, several design methodologies and tools for developing distributed emb- ded control systems have emerged. In spite of these, development of embedded c- trol applications remains a daunting task, requiring a great degree of human skill, expertise, time, and effort. It is imperative to invest signi?cant R&D effort in coming up with methods and tools for future embedded control applications.

Full Product Details

Author:   S. Ramesh ,  P. Sampath
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2007 ed.
Dimensions:   Width: 15.50cm , Height: 1.90cm , Length: 23.50cm
Weight:   1.400kg
ISBN:  

9781402062537


ISBN 10:   1402062532
Pages:   300
Publication Date:   28 August 2007
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Dr. Ramesh is the Chiarman of the ""Next Generation Design and Verification Methodologies for Distributed Embedded Control Systems"", 5 - 6 Jan. 2007 in NIAS Auditorium, IISc Campus, Bangalore, India. He is also a seniro member of the GM R&D, Bangalore, India.

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