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OverviewThe use of ion accelerators for purposes other than nuclear l physics research has expanded to the point where lother uses are now the most typical. The point has been reached where there are as many ion accelerators in industry, as in universities; and the bulk of new accelerator purchases appears to be for applied pur poses. We mention this as introduction to a tribute to an earlier book: IINew Uses of Low Energy Accelerators"" (1968). The authors of tnis book were almost all nuclear physicists. This book ad dressed itself to new uses other than nuclear research. And in great part because of the widespread seminal influence of this book, many of the new uses discussed became mature fields of re search with their own conferences and publications. We have attempted in this book to both update with topics not included in the first book, and to present in a more tutorial and detailed manner the topics discussed. This book is in many ways a joint book. All chapters were the result of considerable collaboration between the authors. We hope that, above all, we have written with clarity. We welcome comments and questions from any reader. James F. Ziegler IBM-Research v CONTENTS CHAPTER 1. Ion-Excited X-Ray Analysis of Environmental Samples Thomas A. Cahill I. Introduction .......•...... Full Product DetailsAuthor: James ZieglerPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of the original 1st ed. 1975 Dimensions: Width: 17.00cm , Height: 2.60cm , Length: 24.40cm Weight: 0.854kg ISBN: 9781468421712ISBN 10: 1468421719 Pages: 482 Publication Date: 19 March 2012 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of Contents1. Ion-Excited X-Ray Analysis of Environmental Samples.- I. Introduction.- II. General Considerations for Ion Beam Analysis of Environmental Samples.- III. Formalism and Optimization.- IV. The UCD/ARB Aerosol Analysis System.- V. Ion-Excited X-Ray Analysis Programs.- 2: Material Analysis by Nuclear Backscattering.- A. Introduction.- B. Applications.- I. Introduction.- II. Ion Implantation.- III. Thin Films: Growth and Deposition.- IV. Thin Film Reactions: Interdiffusion and Compound Formation.- V. Bulk Effects: Composition, Diffusion and Solubility.- VI. Concluding Remarks.- Acknowledgments.- References.- Formalism.- 1. Three Basic Concepts in Backscattering.- 2. Depth Scale in Backscattering Analysis [S].- 3. Height of an Energy Spectrum.- 4. Applications of Backscattering from Elemental Targets.- 5. Application of Backscattering to Compound Targets.- 3: Material Analysis by Means of Nuclear Reactions.- Charged Particle Activation Analysis.- Charged Particle Activation Analysis — Examples.- Prompt Radiation Analysis.- Nonresonant Nuclear Reactions — Gamma Rays Observed.- Nonresonant Nuclear Reactions — Nuclear Particles Observed.- Resonant Nuclear Reactions.- Summary.- Acknowledgment.- References.- 4: Lattice Location of Impurities in Metals and Semiconductors.- I. Introduction.- II. Impurity Detection.- III. The Channeling Technique.- IV. Lattice Location Analysis.- V. Examples.- VI. Summary of the Literature on Channeling Lattice Location Data.- VII. Limitations.- VIII. Conclusions.- References.- 5: Ion Implantation in Metals.- Historical Perspective.- Friction and Wear.- Corrosion.- Ion Backscattering.- Titanium and Stainless Steel.- Zirconium.- Aluminum.- Copper.- Aqueous Corrosion.- Practical Applications in Corrosion.- Electrochemistry and Catalysis.-Implantation Metallurgy.- Equipment for the Ion Implantation of Metals.- Conclusions.- References.- 6: Ion Implantation in Superconductors.- Definition of the Superconducting Parameters.- Influence of Radiation Damage on the Superconducting Properties.- Influence of Implanted Ions on the Superconducting Transition Temperature.- Application to Superconducting Devices.- Conclusions.- References.- 7: Ion-Induced X-Rays from Gas Collisions.- 1. Introduction.- 2. Collision Models.- 3. Measurements of Inner-Shell Excitations.- 4. Discussion of Typical Data.- 5. Summary.- References.- 8: Ion-Induced X-Rays in Solids.- 1. Introduction.- 2. Accelerators and Target Chambers.- 3. The Detection and Analysis of X-Rays.- 4. The Use of Protons and Helium Ions to Generate X-Rays from Solid Targets.- 5. The Use of Heavy Ions to Generate X-Rays from Solid Targets.- 6. Conclusions.- References.- Author Index.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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