Nature-Inspired Computing Paradigms in Systems: Reliability, Availability, Maintainability, Safety and Cost (RAMS+C) and Prognostics and Health Management (PHM)

Author:   Mohamed Arezki Mellal (Université de Boumerdes, Boumerdes, Algeria) ,  Michael G. Pecht (CALCE (Center for Advanced Life Cycle Engineering), University of Maryland, USA)
Publisher:   Elsevier Science Publishing Co Inc
ISBN:  

9780128237496


Pages:   144
Publication Date:   18 June 2021
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Nature-Inspired Computing Paradigms in Systems: Reliability, Availability, Maintainability, Safety and Cost (RAMS+C) and Prognostics and Health Management (PHM)


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Nature-Inspired Computing Paradigms in Systems: Reliability, Availability, Maintainability, Safety and Cost (RAMS+C) and Prognostics and Health Management (PHM) covers several areas that include bioinspired techniques and optimization approaches for system dependability. The book addresses the issue of integration and interaction of the bioinspired techniques in system dependability computing so that intelligent decisions, design, and architectures can be supported. It brings together these emerging areas under the umbrella of bio- and nature-inspired computational intelligence. The primary audience of this book includes experts and developers who want to deepen their understanding of bioinspired computing in basic theory, algorithms, and applications. The book is also intended to be used as a textbook for masters and doctoral students who want to enhance their knowledge and understanding of the role of bioinspired techniques in system dependability.

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Author:   Mohamed Arezki Mellal (Université de Boumerdes, Boumerdes, Algeria) ,  Michael G. Pecht (CALCE (Center for Advanced Life Cycle Engineering), University of Maryland, USA)
Publisher:   Elsevier Science Publishing Co Inc
Imprint:   Academic Press Inc
Weight:   0.270kg
ISBN:  

9780128237496


ISBN 10:   012823749
Pages:   144
Publication Date:   18 June 2021
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Optimization 1. RAMS+C (reliability, availability, maintainability, safety and cost) 2. Optimal design 3. Diagnostic 4. Resilience and vulnerability 5. Prognostics and Health Management (PHM) 6. Risk assessment and mitigation 7. Faults 8. Obsolescence 9. Lifetime and lifecycle prediction Methods of interest include, but are not limited to 10. Genetic algorithms 11. Particle swarm optimization 12. Differential evolution 13. Cuckoo algorithms 14. Artificial bee colony 15. Ant colony optimization 16. Artificial neural networks 17. Brain 18. Inspired computing 19. Hybrid techniques

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Author Information

Prof. Mellal is a Professor at the Department of Mechanical Engineering, Faculty of Technology, M’Hamed Bougara University, Boumerdes, Algeria. He was temporarily associated with Teaching and Research (ATER) at the Department of Industrial Engineering and Maintenance, University Institute of Technology Louis Pasteur, University of Strasbourg, France. He is affiliated to the LMSS Laboratory (Solid Mechanics and Systems Laboratory, M’Hamed Bougara University, Algeria) and was affiliated to the Control, Vision and Robotics team of the ICube Laboratory (The Engineering Science, Computer Science and Imaging Laboratory, University of Strasbourg, France). Prof Mellal has contributed to papers on reliability and cost optimization of fuel cell systems, heat and power dispatch using flower pollination algorithms, and heterogeneous components in pharmaceutical production plants, among many others. He is the founder and director of CALCE (Center for Advanced Life Cycle Engineering) at the University of Maryland, which is funded by over 150 of the world’s leading electronics companies at more than US$6M/year. He is a Professional Engineer, an IEEE Fellow, an ASME Fellow, an SAE Fellow, and an IMAPS Fellow. He is currently serving as editor-in-chief of Circuit World. He served as editor-in-chief of IEEE Access for 6 years, as editor-in-chief of IEEE Transactions on Reliability for 9 years, and as editor-in-chief of Microelectronics Reliability for 16 years. He has also served on three U.S. National Academy of Science studies, two U.S. Congressional investigations in automotive safety, and as an expert to the U.S. FDA. He is also a Chair Professor. He consults for 22 major international electronics companies, providing expertise in strategic planning, design, test, prognostics, IP and risk assessment of electronic products and systems.

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