Overview

Nanoscale ferroelectric materials, regardless of their dimensions (film, wire, island), are receiving great interests from academia and industry due to their various potential applications such as memory and storage devices (Ferroelectric Random Access Memory (FRAM), Probe-based Data Storage (PDS) System, etc), sensors (gas sensor, infrared detector, etc), and actuators (micro-mirrors, ultrasonic devices, etc). This book provides the compass to navigate the unknown sea of information related to the nanoscale phenomena occurring in ferroelectric thin films. The intended audience includes professional researchers and engineers in physics, electronics, chemistry, and materials science who are interested either in nanotechnology or ferroelectrics.

Full Product Details

Author:   Seungbum Hong
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2004 ed.
Dimensions:   Width: 15.50cm , Height: 1.90cm , Length: 23.50cm
Weight:   1.350kg
ISBN:  

9781402076305

ISBN 10:   1402076304
Pages:   288
Publication Date:   31 January 2004
Audience:   General/trade ,  Professional and scholarly ,  College/higher education ,  General ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of print, replaced by POD  
We will order this item for you from a manufatured on demand supplier.

Table of Contents

I. Electrical Characterization in Nanoscale Ferroelectric Capacitor.- I. Testing and characterization of ferroelectric thin film capacitors.- II. Size effects in ferroelectric film capacitors: role of the film thickness and capacitor size.- III. Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy.- IV. Nanoscale domain dynamics in ferroelectric thin films.- V. Polarization switching and fatigue of ferroelectric thin films studied by PFM.- II Nano Domain Manipulation and Visualization in Ferroelectric Materials.- VI. Domain switching and self-polarization in perovskite thin films.- VII. Dynamic-contact electrostatic force microscopy and its application to ferroelectric domain.- VIII. Polarization and charge dynamics in ferroelectric materials with SPM.- IX. Nanoscale investigation of MOCVD-Pb(Zr,Ti)O3 thin films using scanning probe microscopy.- X. SPM measurements of ferroelectrics at MHz frequencies.- XI Application of ferroelectric domains in nanometer scale for high- density storage devices.

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