Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield
Publisher:   Springer New York
ISBN:  

9781283640183


Pages:   176
Publication Date:   01 January 2013
Format:   Electronic book text
Availability:   In stock   Availability explained
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Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield


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Publisher:   Springer New York
Imprint:   Springer New York
ISBN:  

9781283640183


ISBN 10:   128364018
Pages:   176
Publication Date:   01 January 2013
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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