Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
Author:   Mohamed Abu Rahma ,  Mohab Anis
Publisher:   Springer-Verlag New York Inc.
Edition:   2013 ed.
ISBN:  

9781493902200


Pages:   172
Publication Date:   15 October 2014
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield


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Author:   Mohamed Abu Rahma ,  Mohab Anis
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2013 ed.
Dimensions:   Width: 15.50cm , Height: 1.00cm , Length: 23.50cm
Weight:   2.934kg
ISBN:  

9781493902200


ISBN 10:   1493902202
Pages:   172
Publication Date:   15 October 2014
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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