Free Delivery Over $100
|
|
|||
|
||||
OverviewThis book presents an in-depth treatment of various power reduction and speed enhancement techniques based on multiple supply and threshold voltages. A detailed discussion of the sources of power consumption in CMOS circuits will be provided whilst focusing primarily on identifying the mechanisms by which sub-threshold and gate oxide leakage currents are generated. The authors present a comprehensive review of state-of-the-art dynamic, static supply and threshold voltage scaling techniques and discuss the pros and cons of supply and threshold voltage scaling techniques. Full Product DetailsAuthor: Volkan Kursun (University of Wisconsin-Madison, USA) , Eby G. Friedman (University of Rochester, Rochester, NY, USA)Publisher: John Wiley & Sons Inc Imprint: John Wiley & Sons Inc Dimensions: Width: 17.30cm , Height: 2.00cm , Length: 25.20cm Weight: 0.621kg ISBN: 9780470010235ISBN 10: 0470010231 Pages: 242 Publication Date: 11 August 2006 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock  The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationDR VOLKAN KURSUN, Department of Electrical & Computer Engineering, University of Rochester, Rochester, New York 14627-0231, USA. PROFESSOR DR EBY G. FRIEDMAN, Department of Electrical & Computer Engineering , University of Rochester , Rochester, New York 14627-0231, USA. Tab Content 6Author Website:Countries AvailableAll regions |
||||
