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OverviewThis completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Essential reading from the student to the professional level. Full Product DetailsAuthor: Peter LugerPublisher: Walter de Gruyter Imprint: Walter de Gruyter Edition: 2nd ISBN: 9781306569682ISBN 10: 1306569680 Pages: 348 Publication Date: 01 January 2014 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: In stock We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |