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OverviewReliability is a key concern in VLSI systems and transient/intermittent faults, often caused by soft errors, require designers to create special mitigation techniques. This book describes such techniques, spanning all levels of the design flow, to reduce systematically the vulnerability of VLSI systems to soft errors. Readers will be enabled to address soft error issues early in their design flow, allowing them to weigh the implications of dedicating more resources for soft error detection and prevention, against the correlating impact on delay, power and area. Full Product DetailsAuthor: Nagarajan Ranganathan , Koustav BhattacharyaPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2012 ISBN: 9781441993373ISBN 10: 1441993371 Pages: 200 Publication Date: 28 February 2014 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock  The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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