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OverviewEach chapter in this book is written by a group of experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic techniques for device degradation. Different types of probes are considered (electrons, photon and tips) and different microscopies (optical, electron microscopy and tunnelling). It is a reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers. Full Product DetailsAuthor: Juan JimenezPublisher: Taylor & Francis Inc Imprint: CRC Press Inc Dimensions: Width: 15.20cm , Height: 4.50cm , Length: 22.90cm Weight: 1.065kg ISBN: 9781560329411ISBN 10: 1560329416 Pages: 730 Publication Date: 15 November 2002 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contents1. Photoluminescence Imaging 2. MicroRaman Spectroscopy of Semiconductors: Principles and Applications 3. Near-Field Scanning Optical Microscopy of Semiconductor Nanostructures 4. Cross-sectional Scanning Tunneling Microscopy Studies of Heterostructures 5. Application of Transmission Electron Microscopy to Study Interfaces in Optoelectronic Materials 6. Electron Beam Induced Luminescence Studies of Low-dimensional Semiconductor Structures 7. X-ray Topography 8. Selective Etching and Complementary Microprobe Techniques (SFM, EBIC)ReviewsAuthor InformationJuan Jiménez is a Professor at the University of Valladolid, Spain, working in the field of microscopic characterization of semiconductors, using electron (Cathodoluminescence) and optical (photoluminescence, Raman scattering and photocurrent) beams. He has studied the local properties and uniformity of GaAs, SiC, InP and other semiconductors. He received his degree in Physics from the University of Valladolid in 1975 and his PhD from Valladolid in 1979. He undertook postdoctoral work at the University of Montpellier, France from 1978-1981 and received a PhD from Montpellier University in 1981. Tab Content 6Author Website:Countries AvailableAll regions |
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