Microelectronic Manufacturing Yield Reliability and Failure Analysis Iv
Author:   Hartmann ,  Hans-Dieter Hartmann ,  Tohru Tsujide
Publisher:   SPIE Press
Volume:   Vol 3510
ISBN:  

9780819429698


Pages:   248
Publication Date:   30 September 1998
Format:   Paperback
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

Our Price $284.63 Quantity:  
Add to Cart

Share |

Microelectronic Manufacturing Yield Reliability and Failure Analysis Iv


Add your own review!

Overview

A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.

Full Product Details

Author:   Hartmann ,  Hans-Dieter Hartmann ,  Tohru Tsujide
Publisher:   SPIE Press
Imprint:   SPIE Press
Volume:   Vol 3510
Dimensions:   Width: 21.40cm , Height: 1.40cm , Length: 27.30cm
Weight:   0.576kg
ISBN:  

9780819429698


ISBN 10:   0819429694
Pages:   248
Publication Date:   30 September 1998
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

lgn

al

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now