Micro, Nano and Optoelectronics Components and Systems: Reliability and Ionizing Radiation

Author:   Jean-Luc Leray ,  Remi Gaillard
Publisher:   ISTE Ltd and John Wiley & Sons Inc
Volume:   723
ISBN:  

9781848213821


Pages:   320
Publication Date:   04 December 2015
Format:   Hardback
Availability:   Not yet available   Availability explained
This item is yet to be released. You can pre-order this item and we will dispatch it to you upon its release.

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Micro, Nano and Optoelectronics Components and Systems: Reliability and Ionizing Radiation


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Overview

Radiation particles from cosmic rays and solar winds constantly permeate the biosphere, all the way to ground level, where most electronic systems must function. While electronic systems may be less sensitive to radiation than their biological counterparts, one single particle can quickly disrupt functional systems such as power supplies and digital or analog circuits. This book examines radiation effects in electronics and optoelectronics, providing design-in methods to improve the reliability of components and systems. This is essential information for practitioners, engineers, and scientists.

Full Product Details

Author:   Jean-Luc Leray ,  Remi Gaillard
Publisher:   ISTE Ltd and John Wiley & Sons Inc
Imprint:   ISTE Ltd and John Wiley & Sons Inc
Volume:   723
Weight:   0.481kg
ISBN:  

9781848213821


ISBN 10:   1848213824
Pages:   320
Publication Date:   04 December 2015
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Not yet available   Availability explained
This item is yet to be released. You can pre-order this item and we will dispatch it to you upon its release.

Table of Contents

1. Introduction of electronics and optoelectronics physics and technology 2. Radiations 3. Review of modern components in the viewpoint of radiation effects 4. Modeling and designing and Testing of components 5. Application to systems 6. Evolutions and perspectives 7. Scaling laws of radiation effects

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