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OverviewExponentially increasing design complexity has necessitated the adoption of metric driven planning and project management. Metric Driven Design Verification provides the semiconductor industry’s first metric driven based approach to functional verification. A metric based flow is described that focuses on the four steps of: 1. Planning: Defining what needs to be done and the automatically trackable metrics that will be used to measure progress. 2. Execution: Implementing verification environments and then extensively exercising the device under verification utilizing comprehensive, massively parallel regression strategies. 3. Measurement: Automatically capturing the metrics defined in planning to provide objective data with which to manage the verification project. Custom tailoring those metrics through an automated reporting framework to provide all stakeholders a real-time meaningful view of project status. 4. Response: Utilizing the returned metrics to effectively adapt to changing project conditions. Making use of automated response mechanisms to automate engineering processed and management response to streamline project management processes. The primary audience for this book is professional engineers, managers, and executives. It is written in an easily understandable style and consists of four parts. The first three parts are tailored for executives, engineering managers, and engineers respectively. The fourth part presents case studies and commentaries from industry luminaries and experts on metric driven verification. Metric Driven Design Verification brings together the best practices and real-life experiences of several leading electronic companies worldwide in planning and managing verification projects, while automating critical processes. It addresses all aspects of verification and summarizes the different options available to engineers, managers and executives. Full Product DetailsAuthor: Hamilton B. Carter , Shankar G. HemmadyPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of hardcover 1st ed. 2007 Dimensions: Width: 15.50cm , Height: 2.00cm , Length: 23.50cm Weight: 0.599kg ISBN: 9781441942555ISBN 10: 1441942556 Pages: 361 Publication Date: 29 October 2010 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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