MEMS Reliability

Author:   Allyson L. Hartzell ,  Mark G. da Silva ,  Herbert R. Shea
Publisher:   Springer-Verlag New York Inc.
Edition:   2011 ed.
ISBN:  

9781441960177


Pages:   291
Publication Date:   11 November 2010
Format:   Hardback
Availability:   In Print   Availability explained
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MEMS Reliability


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Overview

The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.

Full Product Details

Author:   Allyson L. Hartzell ,  Mark G. da Silva ,  Herbert R. Shea
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2011 ed.
Dimensions:   Width: 15.50cm , Height: 1.90cm , Length: 23.50cm
Weight:   1.340kg
ISBN:  

9781441960177


ISBN 10:   1441960171
Pages:   291
Publication Date:   11 November 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Introduction.- Reliability /Weibull, bathtub curve, basics (What is reliability?).- Failure Modes and Physics of Failure (POF).- Strategies for identifying root cause (FMEA).- Manufacturing Processes & Procedures.- Testing & Qualification Processes & Procedures.- Improving Reliability: Techniques and Tools.- Design for Reliability (DFR).

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