Free Delivery Over $100
|
|
|||
|
||||
OverviewThe successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing. Full Product DetailsAuthor: Allyson L. Hartzell , Mark G. da Silva , Herbert R. SheaPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2011 ed. Dimensions: Width: 15.50cm , Height: 1.60cm , Length: 23.50cm Weight: 0.474kg ISBN: 9781461427360ISBN 10: 1461427363 Pages: 291 Publication Date: 27 December 2012 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
||||
