Mems Reliability

Author:   Allyson L Hartzell ,  Herbert R Shea ,  Mark G Da Silva
Publisher:   Springer Us
ISBN:  

9781299336957


Pages:   299
Publication Date:   01 January 2011
Format:   Undefined
Availability:   In stock   Availability explained
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Mems Reliability


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Overview

The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it.MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.

Full Product Details

Author:   Allyson L Hartzell ,  Herbert R Shea ,  Mark G Da Silva
Publisher:   Springer Us
Imprint:   Springer Us
ISBN:  

9781299336957


ISBN 10:   1299336957
Pages:   299
Publication Date:   01 January 2011
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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