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Overview"When you see a nicely presented set of data, the natural response is: ""How did they do that; what tricks did they use; and how can I do that for myself?"" Alas, usually, you must simply keep wondering, since such tricks-of- the-trade are usually held close to the vest and rarely divulged. Shamefully ignored in the technical literature, measurement and modeling of high-speed semiconductor devices is a fine art. Robust measuring and modeling at the levels of performance found in modern SiGe devices requires extreme dexterity in the laboratory to obtain reliable data, and then a valid model to fit that data. Drawn from the comprehensive and well-reviewed Silicon Heterostructure Handbook, this volume focuses on measurement and modeling of high-speed silicon heterostructure devices. The chapter authors provide experience-based tricks-of-the-trade and the subtle nuances of measuring and modeling advanced devices, making this an important reference for the semiconductor industry. It includes easy-to-reference appendices covering topics such as the properties of silicon and germanium, the generalized Moll-Ross relations, the integral charge-control model, and sample SiGe HBT compact model parameters." Full Product DetailsAuthor: John D. Cressler (Georgia Institute of Technology, Atlanta, USA)Publisher: Taylor & Francis Inc Imprint: CRC Press Inc Dimensions: Width: 17.80cm , Height: 1.40cm , Length: 25.40cm Weight: 0.498kg ISBN: 9781420066920ISBN 10: 1420066927 Pages: 198 Publication Date: 13 December 2007 Audience: Professional and scholarly , Professional & Vocational , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationGeorgia Institute of Technology, Atlanta, USA Tab Content 6Author Website:Countries AvailableAll regions |
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