Overview

* This up-to-date reference for students as well as researchers in the field is the first systematic treatment on the property measurements of organic semiconductor materials. * Following an introduction, the book goes on to treat the structural analysis of thin films and spectroscopy of electronic states.

Full Product Details

Author:   Thorsten U. Kampen
Publisher:   Wiley-VCH Verlag GmbH
Imprint:   Wiley-VCH Verlag GmbH
Dimensions:   Width: 18.00cm , Height: 1.30cm , Length: 24.90cm
Weight:   0.472kg
ISBN:  

9783527406531

ISBN 10:   3527406530
Pages:   175
Publication Date:   26 May 2010
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Awaiting stock  
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Table of Contents

1. Introduction 2. Growth of Thin Films 3. Structural Analysis 4. Optical spectroscopy 5. Electronic and Chemical Surface Properties 6. Charge Transport

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Author Information

Thorsten Kampen is product manager for electron spectroscopy at the SPECS Surface Nano Analysis GmbH and lecturer at the Department of Solid State Physics of the Technical University Berlin, Germany. After having obtained his Ph.D. from the University of Duisburg, he moved on to work at the Technical University of Chemnitz and then in the Molecular Physics Group of the Fritz-Haber-Institute of the Max-Planck-Society in Berlin. His assignments included research stays in the US and Japan. On the national level, Dr. Kampen was involved in projects of the Deutsche Forschungsgemeinschaft DFG.

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