Low-Frequency Noise in Semiconductors

Author:   Purushothaman Srinivasan
Publisher:   Springer-Verlag New York Inc.
Edition:   2013
ISBN:  

9781461420910


Pages:   500
Publication Date:   28 February 2014
Format:   Hardback
Availability:   Not yet available   Availability explained
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Low-Frequency Noise in Semiconductors


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Author:   Purushothaman Srinivasan
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2013
ISBN:  

9781461420910


ISBN 10:   1461420911
Pages:   500
Publication Date:   28 February 2014
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Not yet available   Availability explained
This item is yet to be released. You can pre-order this item and we will dispatch it to you upon its release.

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Purushothaman Srinivasan (SP) is currently a Member of Technical Staff at Texas Instruments, Dallas. He has been involved in the research and development of advanced CMOS devices for low power applications with emphasis on low-frequency (1/f) noise and Random Telegraph Signals (RTS) since 2007. He is also an Executive Committee member and Membership Chair of Dielectric Science and Technology Division at ECS. His activities also include organizer for ECS graphene symposia and More-than-Moore symposia. He currently serves in the SRC Technical Advisory Board and is a liaison member of various SRC projects. Prior to joining TI, he obtained his PhD degree from IMEC, Leuven, Belgium and New Jersey Institute of Technology, Newark, NJ in 2007. He spent his summer of 2006 as a researcher at IBM T. J. Watson Research Center, Yorktown Heights, NY. He won the Hashimoto Prize for his best doctoral dissertation in 2007. He is also a senior member of IEEE, has edited 5 books, holds 3 patents, authored and co-authored more than 70 international publications, including IEDM and VLSI conferences. He also serves as a reviewer for at least 6 journals, including the Journal of The Electrochemical Society and IEEE Transactions on Electron Devices.

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