Free Delivery Over $100
|
|
|||
|
||||
OverviewThis book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells, and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced. Full Product DetailsAuthor: O Breitenstein , W Warta , M LangenkampPublisher: Springer Imprint: Springer Edition: 2nd ISBN: 9781282982062ISBN 10: 1282982060 Pages: 266 Publication Date: 01 January 2010 Audience: General/trade , General Format: Undefined Publisher's Status: Active Availability: In stock  We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
||||
