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OverviewLife-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions. Full Product DetailsAuthor: Sarah B. BoydPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2012 Dimensions: Width: 15.50cm , Height: 1.50cm , Length: 23.50cm Weight: 0.553kg ISBN: 9781441999870ISBN 10: 1441999876 Pages: 226 Publication Date: 12 October 2011 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Awaiting stock The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you. Table of Contents1 Introduction.- 2 Semiconductor LCI Methods.- 3 Semiconductor Manufacturing Trends in Product Type and Geography.- 4 Life-cycle Energy and Global Warming Emissions of CMOS Logic.- 5 Life-cycle Assessment of CMOS Logic.- 6 Life-cycle Assessment of Flash Memory.- 7 Life-cycle Assessment of Dynamic Random Access Memory.- 8 Semiconductor LCA: The Road Ahead.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |