Knowledge-Driven Board-Level Functional Fault Diagnosis

Author:   Fangming Ye ,  Zhaobo Zhang ,  Krishnendu Chakrabarty ,  Xinli Gu
Publisher:   Springer International Publishing AG
Edition:   1st ed. 2017
ISBN:  

9783319402093


Pages:   147
Publication Date:   29 August 2016
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Knowledge-Driven Board-Level Functional Fault Diagnosis


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Author:   Fangming Ye ,  Zhaobo Zhang ,  Krishnendu Chakrabarty ,  Xinli Gu
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   1st ed. 2017
Dimensions:   Width: 15.50cm , Height: 1.10cm , Length: 23.50cm
Weight:   3.731kg
ISBN:  

9783319402093


ISBN 10:   3319402099
Pages:   147
Publication Date:   29 August 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Fangming Ye is a Staff Engineer at Huawei Technologies, with particular research interests in machine learning, data mining, resilient system design, and diagnosis system for board-level faults. Zhaobo Zhang is a Staff Engineer at Huawei Technologies, specializing in Data analysis and machine learning, Network reliability, Application design, Flow standardization, diagnosis automation, and memory test. Krishnendu Chakrabarty is the William H. Younger Distinguished Professor of Engineering in the Department of Electrical and Computer Engineering and Professor of Computer Science at Duke University. He is a recipient of the National Science Foundation Early Faculty (CAREER) award, the Office of Naval Research Young Investigator award, the Humboldt Research Award from the Alexander von Humboldt Foundation, Germany, the IEEE Transactions on CAD Donald O. Pederson Best Paper award (2015), and 11 best paper awards at major IEEE conferences. Heis also a recipient of the IEEE Computer Society Technical Achievement Award (2015) and the Distinguished Alumnus Award from the Indian Institute of Technology, Kharagpur (2014). Prof. Chakrabarty is a Hans Fischer Senior Fellow at the Institute for Advanced Studies, Technical University of Munich, Germany. Prof. Chakrabarty’s current research projects include: testing and design-for-testability of integrated circuits and system; digital microfluidics, biochips, and cyberphysical systems; optimization of enterprise systems and smart manufacturing. He is a Fellow of ACM, a Fellow of IEEE, and a Golden Core Member of the IEEE Computer Society. Prof. Chakrabarty served as the Editor-in-Chief of IEEE Design & Test of Computers during 2010-2012 and ACM Journal on Emerging Technologies in Computing Systems during 2010-2015. Currently he serves as the Editor-in-Chief of IEEE Transactions on VLSI Systems.  Xinli Gu is a Senior Director at Huawei Technologies, where he leads design solution for network product quality and reliability. He also had 12-year experiences with Cisco Systems, responsible for product testability and manufacturing quality at corporate level. 

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