Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
Author:   Lucille A Giannuzzi ,  Lucille A Giannuzzi ,  Fred A Stevie (AT&T Labs., Pennsylvania)
Publisher:   Springer
ISBN:  

9781280147746


Pages:   357
Publication Date:   20 March 2006
Format:   Undefined
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Our Price $607.20 Quantity:  
Add to Cart

Share |

Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice


Add your own review!

Overview

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Full Product Details

Author:   Lucille A Giannuzzi ,  Lucille A Giannuzzi ,  Fred A Stevie (AT&T Labs., Pennsylvania)
Publisher:   Springer
Imprint:   Springer
ISBN:  

9781280147746


ISBN 10:   1280147741
Pages:   357
Publication Date:   20 March 2006
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

lgn

al

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now