Intense Electron and Ion Beams

Author:   Sergey Ivanovich Molokovsky ,  Aleksandr Danilovich Sushkov
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   2005 ed.
ISBN:  

9783540242208


Pages:   281
Publication Date:   21 July 2005
Format:   Hardback
Availability:   In Print   Availability explained
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Intense Electron and Ion Beams


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Overview

Intense Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental installations such as free electron lasers and accelerators. It addresses, among other things, the physics and basic theory of intense charged-particle beams; computation and design of charged-particle guns and focusing systems; multiple-beam charged-particle systems; and experimental methods for investigating intense particle beams. The coverage is carefully balanced between the physics of intense charged-particle beams and the design of optical systems for their formation and focusing. It can be recommended to all scientists studying or applying vacuum electronics and charged-particle beam technology, including students, engineers, and researchers.

Full Product Details

Author:   Sergey Ivanovich Molokovsky ,  Aleksandr Danilovich Sushkov
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2005 ed.
Dimensions:   Width: 15.50cm , Height: 1.70cm , Length: 23.50cm
Weight:   1.310kg
ISBN:  

9783540242208


ISBN 10:   3540242201
Pages:   281
Publication Date:   21 July 2005
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

to Particle-Beam Formation.- Methods of Fields Calculation.- Fundamentals of Charged-Particle Motion.- Motion of Intense Charged-Particle Beams.- Electron Guns.- Electron and Ion Sources with Field and Plasma Emitters.- Magnetic Focusing Systems.- Electrostatic Focusing Systems.- Optical Systems of Technological Installations.- Intense Relativistic Charged-Particle Beams.- Multiple-Beam Electron-Optical Systems.- Methods of Experimental Investigation of Beams.

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