Integrated Circuit Quality and Reliability

Author:   Eugene R. Hnatek (Encinitas, California, USA)
Publisher:   Taylor & Francis Inc
Edition:   2nd edition
Volume:   v. 91
ISBN:  

9780824792831


Pages:   808
Publication Date:   01 December 1994
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Integrated Circuit Quality and Reliability


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Full Product Details

Author:   Eugene R. Hnatek (Encinitas, California, USA)
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Edition:   2nd edition
Volume:   v. 91
Dimensions:   Width: 15.20cm , Height: 4.20cm , Length: 22.90cm
Weight:   1.650kg
ISBN:  

9780824792831


ISBN 10:   0824792831
Pages:   808
Publication Date:   01 December 1994
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Reviews

The new edition brings the baseline IC technology and tool set up to date. . ..it covers all the material in more depth than the first edition. . .. . . .a good tutorial on IC fabrication and packaging, including quality concerns. . .. Excellent chapters on design, fabrication, packaging, and test put today's engineer in a good position to understand the impact of contamination and manufacturing errors on their IC products. ---IEEE Components, Packaging, and Manufacturing Technology Society Newsletter


Author Information

Hnatek, Eugene R.

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