Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Author:   José Pineda de Gyvez
Publisher:   Kluwer Academic Publishers
Edition:   1993 ed.
Volume:   208
ISBN:  

9780792393061


Pages:   167
Publication Date:   31 December 1992
Format:   Hardback
Availability:   In Print   Availability explained
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Integrated Circuit Defect-Sensitivity: Theory and Computational Models


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Author:   José Pineda de Gyvez
Publisher:   Kluwer Academic Publishers
Imprint:   Kluwer Academic Publishers
Edition:   1993 ed.
Volume:   208
Dimensions:   Width: 15.50cm , Height: 1.20cm , Length: 23.50cm
Weight:   1.000kg
ISBN:  

9780792393061


ISBN 10:   0792393066
Pages:   167
Publication Date:   31 December 1992
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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