Industrial X-Ray Computed Tomography

Author:   Simone Carmignato ,  Wim Dewulf ,  Richard Leach
Publisher:   Springer International Publishing AG
Edition:   1st ed. 2018
ISBN:  

9783319595719


Pages:   369
Publication Date:   27 October 2017
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Industrial X-Ray Computed Tomography


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Author:   Simone Carmignato ,  Wim Dewulf ,  Richard Leach
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   1st ed. 2018
Weight:   0.895kg
ISBN:  

9783319595719


ISBN 10:   3319595717
Pages:   369
Publication Date:   27 October 2017
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Simone Carmignato is Professor of Manufacturing Engineering and Manufacturing Metrology at the University of Padua, Italy. His research activities are in the area of precision engineering and dimensional metrology, with focus on industrial computed tomography and advanced coordinate metrology. In 2012, he was awarded the F. W. Taylor Medal from CIRP, the International Academy for Production Engineering. Wim Dewulf holds a Professorship in the Department of Mechanical Engineering at KU Leuven, Belgium, where he is leading research groups on Sustainable Engineering and on Dimensional Metrology. In the latter field, his major research themes include X-ray computed tomography, multi-sensor metrology, and automated inspection planning. He was, amongst others, coordinating the highly successful INTERAQCT project, which provided an extensive industrial-academic training environment for young researchers in the field of X-ray CT metrology.  Richard Leach is Chair in Metrology at The University of Nottingham, UK, and heads up the Manufacturing Metrology Team. Richard’s current interests are the dimensional measurement of precision and additive manufactured structures. His research themes include the measurement of surface topography, development of methods for measuring 3D structures, development of methods for controlling large surfaces to high resolution in industrial applications and x-ray computed tomography.   

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