In-Line Characterization Yield Reliability and Failure Analyses In Microelectronic Manufacturing
Author:   Amberiadis ,  Gudrun Kissinger (Institute of Semiconductor Physics, Germany) ,  Katsuya Okumura ,  Seshu Pabbisetty
Publisher:   SPIE Press
Edition:   New ed.
Volume:   Vol 3743
ISBN:  

9780819432230


Pages:   344
Publication Date:   30 April 1999
Format:   Paperback
Availability:   To order   Availability explained
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In-Line Characterization Yield Reliability and Failure Analyses In Microelectronic Manufacturing


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Author:   Amberiadis ,  Gudrun Kissinger (Institute of Semiconductor Physics, Germany) ,  Katsuya Okumura ,  Seshu Pabbisetty
Publisher:   SPIE Press
Imprint:   SPIE Press
Edition:   New ed.
Volume:   Vol 3743
ISBN:  

9780819432230


ISBN 10:   0819432237
Pages:   344
Publication Date:   30 April 1999
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

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