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Author:   R. K. Willardson (WILLARDSON CONSULTING SPOKANE, WASHINGTON) ,  Eicke R. Weber (Fraunhofer-Institut für Solare Energiesysteme ISE, Freiburg, Germany) ,  Michael Stavola (Lehigh University, Bethlehem, Pennsylvania)
Publisher:   Elsevier Science Publishing Co Inc
Imprint:   Academic Press Inc
Volume:   v. 51A
Dimensions:   Width: 15.20cm , Height: 2.50cm , Length: 22.90cm
Weight:   0.800kg
ISBN:  

9780127521596

ISBN 10:   0127521593
Pages:   376
Publication Date:   02 July 1998
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   In Print  
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

Table of Contents

List of Contributors. Preface. G.D. Watkins, EPR and ENDOR Studies of Defects in Semiconductors. J.M. Spaeth, Magneto-optical and Electrical Detection of Paramagnetic Resonance in Semiconductors. T.A. Kennedy and E.R. Glaser, Magnetic Resonance of Epitaxial Layers Detected by Photoluminescence. K.H. Chow, B.Hitti and R.F. Kiefl, uSR on Muonium in Semiconductors and its Relation to Hydrogen. K.Saarinen, P.Hautojarvi, and C. Corbel, Positron Annihilation Sprectroscopy of Defects in Semiconductors. R. Jones and P.R. Briddon, The Ab Initio Cluster Method and the Dynamics of Defects in Semiconductors. Subject Index. Contents of Volumes in This Series.

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Prof. Dr. Eicke R. Weber, Fraunhofer-Institut fur Solare Energiesysteme ISE, Freiburg, Germany

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