Hot-Carrier Reliability of MOS VLSI Circuits
Author:   Yusuf Leblebici ,  Sung-Mo (Steve) Kang
Publisher:   Kluwer Academic Publishers
Edition:   1993 ed.
Volume:   227
ISBN:  

9780792393528


Pages:   212
Publication Date:   30 June 1993
Format:   Hardback
Availability:   In Print   Availability explained
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Hot-Carrier Reliability of MOS VLSI Circuits


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Author:   Yusuf Leblebici ,  Sung-Mo (Steve) Kang
Publisher:   Kluwer Academic Publishers
Imprint:   Kluwer Academic Publishers
Edition:   1993 ed.
Volume:   227
Dimensions:   Width: 15.50cm , Height: 1.40cm , Length: 23.50cm
Weight:   1.130kg
ISBN:  

9780792393528


ISBN 10:   079239352
Pages:   212
Publication Date:   30 June 1993
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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