Hot-Carrier Effects in MOS Devices
Author:   Eiji Takeda (Hitachi Ltd.) ,  Cary Y. Yang (Santa Clara University) ,  Akemi Miura-Hamada (Hitachi Ltd.)
Publisher:   Elsevier Science Publishing Co Inc
ISBN:  

9780126822403


Pages:   312
Publication Date:   28 November 1995
Format:   Hardback
Availability:   Out of print, replaced by POD   Availability explained
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Hot-Carrier Effects in MOS Devices


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Author:   Eiji Takeda (Hitachi Ltd.) ,  Cary Y. Yang (Santa Clara University) ,  Akemi Miura-Hamada (Hitachi Ltd.)
Publisher:   Elsevier Science Publishing Co Inc
Imprint:   Academic Press Inc
Dimensions:   Width: 15.20cm , Height: 1.80cm , Length: 22.90cm
Weight:   0.580kg
ISBN:  

9780126822403


ISBN 10:   0126822409
Pages:   312
Publication Date:   28 November 1995
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of print, replaced by POD   Availability explained
We will order this item for you from a manufatured on demand supplier.

Table of Contents

MOS Device Fundamentals Hot-Carrier Injection Mechanisms Hot-Carrier Device Degradation AC and Process-Induced Hot-Carrier Effects Hot-Carrier Effects at Low Temperature and Low Voltage Dependence of Hot-Carrier Phenomena on Device Structure As-P Double Diffused Drain (DDD) Versus Lightly Doped Drain (LDD) Devices Gate-to-Drain Overlatpped Devices (GOLD)

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