High Resolution X-Ray Diffractometry and Topography
Author:   D Keith Bowen ,  Brian K Tanner
Publisher:   Taylor & Francis Group
ISBN:  

9781280242090


Pages:   264
Publication Date:   01 January 1998
Format:   Electronic book text
Availability:   In stock   Availability explained
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High Resolution X-Ray Diffractometry and Topography


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Author:   D Keith Bowen ,  Brian K Tanner
Publisher:   Taylor & Francis Group
Imprint:   Taylor & Francis Group
ISBN:  

9781280242090


ISBN 10:   1280242094
Pages:   264
Publication Date:   01 January 1998
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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