Overview

This guide helps engineers solve design problems related to the new high frequency standard in electronics. It takes the mystery out of how to make necessary measurements, interpret results, and engineer solutions to specific noise problems. The relationship between high frequency noise to final product reliability and Electromagnetic Inference (EMI) performance is fully clarified, and guidelines to writing meaningful specifications on noise performance are provided. Users also gain an understanding of the transition between the time and frequency domains.

Full Product Details

Author:   Douglas C. Smith
Publisher:   Van Nostrand Reinhold Inc.,U.S.
Imprint:   Van Nostrand Reinhold Inc.,U.S.
Edition:   1993 ed.
Dimensions:   Width: 15.60cm , Height: 1.50cm , Length: 23.40cm
Weight:   1.180kg
ISBN:  

9780442006365

ISBN 10:   0442006365
Pages:   232
Publication Date:   31 December 1992
Audience:   Professional and scholarly ,  General/trade ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Theoretical background. Practical background/probes. Probe ground lead effects, resonance, and induction. Probe compensation. Differential measurements. Non-contact measurements and magnetic loops. Current probes. Development lab EMC measurements. Measurements in a high inference environment. Digital scopes. Case histories.

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