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OverviewFull Product DetailsAuthor: Yoshio Nishi (Stanford University, California, USA) , Robert Doering (Texas Instruments, Dallas, USA) , Alain C. Diebold (Sematech, Austin, Texas, USA) , Robert Doering (Texas Instruments, Dallas, USA)Publisher: Taylor & Francis Inc Imprint: CRC Press Inc Edition: 2nd edition Dimensions: Width: 17.80cm , Height: 6.80cm , Length: 25.40cm Weight: 2.572kg ISBN: 9781574446753ISBN 10: 1574446754 Pages: 1720 Publication Date: 09 July 2007 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationTexas Instruments, Dallas, USA Stanford University, California, USA Tab Content 6Author Website:Countries AvailableAll regions |