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OverviewFull Product DetailsAuthor: Jerome J. Cuomo , Stephen M. Rossnagel , Harold R. KaufmanPublisher: William Andrew Publishing Imprint: William Andrew Publishing Dimensions: Width: 15.20cm , Height: 2.50cm , Length: 22.90cm Weight: 0.710kg ISBN: 9780815511991ISBN 10: 081551199 Pages: 456 Publication Date: 31 December 1989 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Out of Print Availability: In Print Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock. Table of ContentsPerspective on Past, Present and Future Uses of Ion Beam Technology Part I. Ion Beam Technology Gridded Broad-beam Ion Sources ECR Ion Sources Hall Effect Ion Sources Ionized Cluster Beam (ICB) Deposition and Epitaxy Part II. Sputtering Phenomena Quantitative Sputtering Laser-induced Fluorescence as a Tool for the Study of Ion Beam Sputtering Characterization of Atoms Desorbed from Surfaces by Ion Bombardment Using Multiphoton Ionization Detection Part III. Film Modification and Synthesis The Modification of Films by Ion Bombardment Control of Film Properties by Ion-assisted Deposition Using Broad Beam Sources Etching with Directed Beams Film Growth Modification by Concurrent Ion Bombardment: Theory and Simulation Interface Structure and Thin Film Adhesion Modification of Thin Films by Off-normal Incidence Ion Bombardment Ion Beam Interactions with Polymer Surfaces Topography: Texturing Effects Methods and Techniques of Ion Beam Processes Ion-assisted Dielectric and Optical Coatings Diamond and Diamond-like Thin Films by Ion Beam Techniques IndexReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |