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OverviewFull Product DetailsAuthor: William LiuPublisher: John Wiley and Sons Ltd Imprint: John Wiley & Sons Inc Dimensions: Width: 18.70cm , Height: 5.50cm , Length: 25.80cm Weight: 2.212kg ISBN: 9780471249047ISBN 10: 0471249041 Pages: 1284 Publication Date: 27 April 1998 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Out of Stock Indefinitely Availability: Out of stock  Table of ContentsBasic Properties and Device Physics of III--V Materials.; Two--Terminal Heterojunction Devices.; D.C.; Current Gain.; Nonideal D.C.; Characteristics.; Thermal--Electrical Properties.; Collapse of Current Gain.; Failure Mechanisms and Reliability Issues.; Small--Signal Properties.; Epitaxial Layer Design.; Geometrical Layout Design.; Power Amplifier.; Distortion and Noise.; Switching Characteristics and Spice Models.; Transistor Fabrication.; Measured Transistor Performances.; Appendices.; Glossary of Symbols.; Index.ReviewsAuthor InformationWILLIAM LIU is a senior member of the technical staff at Texas Instruments, where he has worked since obtaining his PhD in electrical engineering from Stanford University in 1991. Dr. Liu has published numerous papers, reviews, and chapter contributions on HBTs. He holds thirteen U.S. patents on device and circuit design in various HBT technologies. He is a senior member of the IEEE. Tab Content 6Author Website:Countries AvailableAll regions |
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