Overview

This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices. The volume comprises 93 contributions; among them, 14 invited papers, from more than 20 different countries. The invited papers, submitted by internationally recognized experts in the field, review the state-of-the-art and likely future trends in their respective research field. Upon comparing this volume with previous volumes, it is clearly seen that defect engineering in photovoltaics is becoming a topic of ever-increasing interest. The collection is divided into the chapters: - Multi-crystalline silicon for solar cells, - Advanced semiconductor materials: Strained Si, SOI, SiGe, SiC, - Impurities (oxygen, carbon, nitrogen, metals) and point defects in Si and SiGe, - Modeling and simulation of growth, gettering and characterization, - Defect aspects and defect engineering, - Gettering and hydrogen passivation, - Defect and impurity characterization, - Nanostructures and new devices, - Silicon-based opto-electronics and defect luminescence.

Full Product Details

Author:   M. Kittler ,  H. Richter
Publisher:   Trans Tech Publications Ltd
Imprint:   Trans Tech Publications Ltd
Volume:   v. 156-158
ISBN:  

9783908451747

ISBN 10:   3908451744
Pages:   610
Publication Date:   February 2010
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Awaiting stock  
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