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OverviewFull Product DetailsAuthor: Cor Claeys (Interuniversity MicroElectronics Center (IMEC), Leuven, Belgium and Katholieke Universiteit Leuven, Belgium) , Eddy Simoen (Interuniversity Microelectronics Center (IMEC), Leuven, Belgium and Katholieke Universiteit Leuven, Belgium)Publisher: Elsevier Science & Technology Imprint: Elsevier Science Ltd Dimensions: Width: 16.50cm , Height: 3.10cm , Length: 24.00cm Weight: 1.020kg ISBN: 9780080449531ISBN 10: 0080449530 Pages: 480 Publication Date: 23 March 2007 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock  The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsIntroduction (C. Claeys, E. Simoen). Chapter 1. Germanium Materials (B. Depuyt et al.). Chapter 2. Grown-in Defects in Ge (J. Vanhellemont et al.). Chapter 3. Diffusion and Solubility of Dopants in Germanium (E. Simoen, C. Claeys). Chapter 4. Oxygen in Silicon (P. Clauws). Chapter 5. Metals in Germanium (E. Simoen, C. Claeys). Chapter 6. Ab-initio Modelling of Defects in Germanium (R. Jones, J. Coutinho). Chapter 7. Radiation Performance of Ge Technologies (V. Markevich et al.). Chapter 8. Electrical Performance of Devices (M. Houssa et al.). Chapter 9. Device Modeling (D. Esseni et al.). Chapter 10. Nanoscale Germanium MOS Dielectrics and Junctions (C. On Chui, K.C. Saraswat). Chapter 11. Advanced Germanium MOS Devices (C. On Chui, K.C. Saraswat). Chapter 12. Alternative Ge Applications. Chapter 13. Trends and Outlook (E. Simoen, C. Claeys).ReviewsAuthor InformationEddy Simoen is a Senior Researcher at IMEC, where he is currently involved in research on the defect and strain engineering in high-mobility and epitaxial substrates and defect studies in germanium and III-V compounds. Tab Content 6Author Website:Countries AvailableAll regions |
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