|
|
|||
|
||||
OverviewFull Product DetailsAuthor: Amit ChaudhryPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of the original 1st ed. 2013 Dimensions: Width: 15.50cm , Height: 1.20cm , Length: 23.50cm Weight: 3.343kg ISBN: 9781493944828ISBN 10: 1493944827 Pages: 201 Publication Date: 23 August 2016 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand We will order this item for you from a manufactured on demand supplier. Table of ContentsScaling of a MOS Transistor.- Nanoscale Effects- Gate Oxide Leakage Currents.- Nanoscale Effects- Inversion Layer Quantization.- Dielectrics for Nanoelectronics.- Germanium Technology.- Biaxial s-Si Technology.- Uniaxial s-Si Technology.- Alternate MOS Structures.- Graphene Technology.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |