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OverviewFunctional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: techniques for bug trace minimization that simplify debugging; an RTL error diagnosis method that identifies the root cause of errors directly; a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; a symmetry-based rewiring technology for fixing electrical errors; an incremental verification system for physical synthesis; and, an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. Full Product DetailsAuthor: Kai-Hui Chang , Igor Markov , Valeria BertaccoPublisher: Springer Imprint: Springer ISBN: 9786611920494ISBN 10: 6611920498 Pages: 212 Publication Date: 01 January 2009 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Out of stock  The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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