Flatness, Roughness, and Discrete Defects Characterization for Computer Disks Wafers, and Flat Panel Displays II (Spie Proceedings Series Volume 3275)
Author:   Stover ,  John C Stover
Publisher:   SPIE Press
ISBN:  

9780819427144


Pages:   186
Publication Date:   30 June 2006
Format:   Paperback
Availability:   To order   Availability explained
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Flatness, Roughness, and Discrete Defects Characterization for Computer Disks Wafers, and Flat Panel Displays II (Spie Proceedings Series Volume 3275)


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Author:   Stover ,  John C Stover
Publisher:   SPIE Press
Imprint:   SPIE Press
Dimensions:   Width: 21.00cm , Height: 1.90cm , Length: 26.70cm
Weight:   0.454kg
ISBN:  

9780819427144


ISBN 10:   0819427144
Pages:   186
Publication Date:   30 June 2006
Audience:   General/trade ,  College/higher education ,  Professional and scholarly ,  General ,  Undergraduate
Format:   Paperback
Publisher's Status:   Active
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

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