Overview

Most of the applications of electronics require non-volatile memories, which can keep stored information when the power supply is switched off. Flash memories (in which a single cell can be electrically programmed and a large number of cells are usually electrically erased at the same time) are the most versatile non-volatile memories. They are widely used to store the basic input-output system (BIOS) of personal computers, the software and personal data of cellular phones, identification codes in smart cards and many other applications. Flash memories allow software updates, change of passwords and codes, and reconfiguration of the system in the field. They can be designed and optimized to create large-size memories which can successfully substitute hard disks for specific applications, having lower power consumption and weight, shorter access times, and far better robustness. This book is devoted entirely to flash memories and has been designed to provide comprehensive information on basic memory cell structures, device physics and technology, simulation circuit architecture, system issues, testing and reliability. It also provides data on advanced subjects related to multi-level storage cells, embedded memories and system applications of flash memories.

Full Product Details

Author:   Paulo Cappelletti ,  Carla Golla ,  Piero Olivo ,  Enrico Zanoni
Publisher:   Springer
Imprint:   Springer
Edition:   1999 ed.
Dimensions:   Width: 15.50cm , Height: 3.00cm , Length: 23.50cm
Weight:   2.100kg
ISBN:  

9780792384878

ISBN 10:   0792384873
Pages:   540
Publication Date:   30 June 1999
Audience:   Professional and scholarly ,  General/trade ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

1 Flash Memories: An Overview.- 1.1 Role of Non Volatile Memories in Microelectronic Systems and in Semiconductor Market.- 1.2 Evolution of Non-volatile Memories.- 1.3 The Floating Gate Device.- 1 4 Charge Injection Mechanisms.- 1 5 Erasable Programmable Read Only Memories.- 1.6 Electrically Erasable Programmable Read Only Memories.- 1.7 Flash Memories. The Basic ETOX Cell. Programming and Erasing Mechanisms.- 1.8 Memory NOR Architecture and Related Issues.- 1.9 The NAND Flash Mass Storage Concept.- 1.10 Embedded Flash Memories.- 1 11 The Future of Flash Memories.- References.- 2 The Industry Standard Flash Memory Cell.- 2.1 Introduction.- 2.2 Basic Structure.- 2.3 Operating Conditions.- 2.4 Technology and Process.- 2 5 Yield and Reliability.- 2.6 Scaling Issues.- References.- 3 Binary and Multilevel Flash Cells.- 3 1 Introduction to Flash Cell Design.- 3.2 Binary Flash Cells.- 3.3 Multilevel Flash Cells.- References.- 4 Physical Aspects of Cell Operation and Reliability.- 4.1 Introduction.- 4.2 Electronic Properties of Carriers and MOS Structures.- 4.3 Fundamentals of Tunneling Phenomena.- 4.4 Tunneling Phenomena in MOSFETs.- 4.5 Fundamentals of Carrier Transport.- 4.6 Hot Carrier Effects in MOSFETs.- 4.7 Oxide Degradation due to High Field Stress.- 4.8 Oxide and Interface Degradation due to Hot Carrier Injection.- References.- 5 Memory Architecture and Related Issues.- 5.1 Flash Architecture: General Overview.- 5.2 Read Path: Decoding.- 5.4 Read Path: Sensing Techniques 280 5 4 1 Sensing Techniques: An Overview.- 5.5 Program Operation Circuitry.- 5 6 Erase Operation Circuitry.- 5.7 Control Logic and Embedded Algorithms.- 5 8 Redundancy and Error Correction Codes.- 6 Multilevel Flash Memories.- 6 1 Introduction.- 6.2 Array Architectures for Multilevel Flash Memories.-6 3 Multilevel Sensing.- 6.4 Multilevel Programming.- 6 5 Conclusions.- References.- 7 Flash Memory Reliability.- 7 1 Introduction.- 7.2 Memory Array Vt Distributions and Tunnel Oxide “Defects”.- 7.3 Main Yield and Reliability Issues.- 7.4 Testing for Reliability.- 7 5 Failure Modes Induced by Program/Erase Cycling.- 7.6 Multilevel Storage Reliability.- 7.7 Conclusion.- References.- 8 Flash Memory Testing.- 8.1 Introduction.- 8.2 Flash Testing Aspects.- 8 3 Flash Testability Tools.- 8.4 Fault Repairing.- 8.5 Production Testing.- 8.6 Test Productivity.- 8.7 Product Characterization.- 8.8 Conclusions.- References.- 9 Flash Memories: Market, Marketing and Economic Challenges.- 9.1 Introduction.- 9.2 Market Segmentations.- 9.3 Customer/Supplier Relationship.- 9.4 The Development of the Flash Market.- 9.5 Flash Memory and the “Economy”.- 9.6 Applications More in Detail.- 9.7 Conclusions.- References.

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