Extreme Statistics in Nanoscale Memory Design

Author:   Amith Singhee ,  Rob A Rutenbar
Publisher:   Springer
ISBN:  

9781441966070


Pages:   258
Publication Date:   13 September 2010
Format:   Undefined
Availability:   Out of stock   Availability explained


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Extreme Statistics in Nanoscale Memory Design


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Overview

This book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations, and provides solutions recently proposed in the Electronic Design Automation (EDA) community. The material serves as a comprehensive reference for researchers and practitioners interested in the problem of estimating extreme statistics for memories.

Full Product Details

Author:   Amith Singhee ,  Rob A Rutenbar
Publisher:   Springer
Imprint:   Springer
Dimensions:   Width: 23.40cm , Height: 1.40cm , Length: 15.60cm
Weight:   0.367kg
ISBN:  

9781441966070


ISBN 10:   1441966072
Pages:   258
Publication Date:   13 September 2010
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Unknown
Availability:   Out of stock   Availability explained

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