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OverviewThis book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations, and provides solutions recently proposed in the Electronic Design Automation (EDA) community. The material serves as a comprehensive reference for researchers and practitioners interested in the problem of estimating extreme statistics for memories. Full Product DetailsAuthor: Amith Singhee , Rob A Rutenbar (Carnegie Mellon Univ. Carnegie Mellon University Carnegie Mellon University Carnegie Mellon University Carnegie Mellon University Carnegie Mellon University)Publisher: Springer Imprint: Springer ISBN: 9781282981836ISBN 10: 1282981838 Pages: 254 Publication Date: 01 January 2010 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: In stock  We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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