Overview

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means ""meeting the user's needs at a minimum cost"". The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.

Full Product Details

Author:   M. Bushnell ,  Vishwani Agrawal
Publisher:   Springer
Imprint:   Springer
Edition:   1st Corrected ed. 2002. Corr. 2nd printing 2004
Volume:   17
Dimensions:   Width: 17.80cm , Height: 3.80cm , Length: 25.40cm
Weight:   3.180kg
ISBN:  

9780792379911

ISBN 10:   0792379918
Pages:   690
Publication Date:   30 November 2000
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

to Testing.- VLSI Testing Process and Test Equipment.- Test Economics and Product Quality.- Fault Modeling.- Test Methods.- Logic and Fault Simulation.- Testability Measures.- Combinational Circuit Test Generation.- Sequential Circuit Test Generation.- Memory Test.- DSP-Based Analog and Mixed-Signal Test.- Model-Based Analog and Mixed-Signal Test.- Delay Test.- IDDQ Test.- Design for Testability.- Digital DFT and Scan Design.- Built-In Self-Test.- Boundary Scan Standard.- Analog Test Bus Standard.- System Test and Core-Based Design.- The Future of Testing.

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