|
|
|||
|
||||
OverviewThis book is a collection of the miscellaneous knowledge essential for transistor-level LSI circuit design, summarized as the issues that need to be considered in each design step. To design an LSI that actually functions and to be able to properly measure it, an extremely large amount of diverse, detailed knowledge is necessary. Even though one may read a textbook about an op-amp, for example, the op-amp circuit design may not actually be possible to complete in one’s CAD tools. The first half of this text explains important design issues such as the operating principles of CAD tools, including schematic entry, SPICE simulation, layout and verification, and RC extraction. Then, mistake-prone topics for many circuit design beginners, resulting from their lack of consideration of these subjects, are explained including IO buffers, noise, and problems due tothe progress of miniaturization. Following these topics, basic but very specialized issues for LSI circuit measurement are explained including measurement devices and measurement techniques. Readers will have the simulated experience of the whole flow from top to bottom of circuit design and measurement. The book will be useful for newcomers to a lab or to new graduates who are assigned to a circuit design group but have little experience in circuit design. This published work is also ideal for those who have some experience in circuit design, to confirm and complement the knowledge that they already possess. Full Product DetailsAuthor: Toru Nakura , Yuta ToriyamaPublisher: Springer Verlag, Singapore Imprint: Springer Verlag, Singapore Edition: Softcover reprint of the original 1st ed. 2016 Weight: 3.868kg ISBN: 9789811091582ISBN 10: 9811091587 Pages: 211 Publication Date: 27 May 2018 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand We will order this item for you from a manufactured on demand supplier. Language: English Table of ContentsSchematic Entry.- SPICE Simulation.- Layout and Verification.- Interconnect RC Extraction.- IO Buffers.- Noise.- Problems due to the Progress of Miniaturization.- Measurement Devices.- Measurement TechniquesWe.- The Overall Design Procedure.ReviewsAuthor InformationToru NakuraAssociate Professor, The University of Tokyo Tab Content 6Author Website:Countries AvailableAll regions |